mApp | MPDV | AI-based OEE Analysis

AI-based OEE Analysis

MPDV Mikrolab GmbH

Analyzing the OEE with Artificial Intelligence (AI)

The KPI OEE, also known as Overall Equipment Effectiveness, is one of the most important indicators for productivity in the Smart Factory. The OEE is made up of the three factors availability, performance, and quality and covers a wide range of information. The KPI stands for a global assessment making sure that an increase in performance is not achieved at the expense of the machine or quality. Influencing factors like machines, tools, material, and articles to be produced affect the OEE index, both individually and in any combination.

The mApp AI-based OEE Analysis uses innovative AI algorithms supporting you to identify correlations and find out where machine losses can be reduced, and production efficiency can be increased. The development of the OEE over time can be displayed in graphics for specific combinations of production resources to analyze the effectiveness of the measures taken. This means that based on reliable data, you will know how to increase production efficiency in future.

Your Benefits

You can use the AI-based analysis of collected production data to identify the conditions that improve or impair the OEE. As a result, you can take appropriate measures to boost productivity.

Technical information

The mApp mApp AI-based OEE Analysis is part of the HYDRA X categories Resource Management and of the AI Suite.

The mApp uses data of the Virtual Production Reality (ViPR) of MPDV's Manufacturing Integration Platform (MIP).

AI-based OEE Analysis in the MIP ecosystem

KPIs like the OEE index and how they are calculated are essential for keeping an eye on machine productivity. MPDV also offers the following mApps:

 

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